Abstract:

The characterization of defects in glass production is the most crucial factor affecting the glass production process. Accurate and fast characterization is important in terms of detecting the source of defects and preventing the formation of defects. Whether the glass defects are gas, amorphous (knot/cord), or crystalline (stone) is important for determining the technique to be applied in finding the source of the defect. Different analysis techniques have been applied to determine the properties of various solid (stone) glass defects. In this study, which aims to characterize and define the solid glass defects (stone) affecting the glass quality and to determine the source of the defect correctly; glass defects were examined by Micro X-ray Diffraction, Micro Raman Spectroscopy, and Fourier Transform Infrared Spectrometry methods as an alternative to the currently used Scanning Electron Microscopy and Energy Dispersive X-ray Spectroscopy methods. The characterization of glass defects by Scanning Electron Microscopy and Energy Dispersive X-ray Spectroscopy method is performed together with microstructure examination and semi-quantitative chemical analysis. With Micro X-ray Diffraction, the defect is qualitatively identified by phase detection. Micro Raman Spectroscopy and Fourier Transform Infrared Spectrometer give results according to the molecular bond characterization of the crystalline inclusions (stone defects). In this study, different types of defects were examined with these methods, then these four methods were compared, and their applicability was evaluated. As a result of the study, these four methods were compared, and their applicability was evaluated. Interpretation of the results is very important since the four methods examined are analysis techniques based on different foundations. While microstructural examination and semi-quantitative results are assessed in Scanning Electron Microscopy and Energy Dispersive X-ray Spectroscopy method, it is possible to get an idea about the formation temperatures of solid glass defects since qualitative determination can be made by phase determination from the analyses made by Micro X-ray Diffraction method. It has been observed that the defect should be homogeneous while obtaining qualitative results in Micro Raman analysis. Although qualitative results are obtained with the spectrum obtained in Fourier Transform Infrared Spectrometer analysis, a detailed literature search is required for the interpretation of the data. Although the most appropriate method for defect determination varies depending on the defect type and crystal structure, it will be µXRD, which supports the findings obtained by stereo microscope and SEM-EDS with phase determination. The importance of phase determination is that it provides the opportunity to make predictions about the source of the error, as it can be commented on the crystal formation temperature.

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