Özet:

In this study, the bullet sulphur quantum point (PbS QD) thin films were produced on the soda-crypt silicate glass substrates using the turning cover method. Quantum point fine film samples were used in cooling spectroscopy and photoluminescence (PL) emission spectroscopy methods to study the optical characteristics. Spectroscopic method results showed that the produced thin films were optically active in the near-rown area (near-IR) as expected. For the determination of the structural characteristics of the produced quantum point fine films, parallel-oriented Raman spectroscopy, atomic force microscope (AFM) and scanned electron microscope (SEM) measurements were made. In the results of the ram spectroscopy, the PbS structure was observed in the optical mode (TO) and in the length optical mode (LO). From the AFM analysis of the produced films, the surface smoothness was estimated at 2.11 nm and the surface particle sizes varied in an average range of 0.5 nm to 1.0 nm. From the SEM images, the presence of very small holes (pinhole) within the organic layer and structures on the surface of the sample that was not washed with methanol and thermal processed after production was detected. In the SEM images of the samples that were washed and thermal processed under the low head, methanol washing and organic layer were removed from the structure and very small holes were closed by quantum points after thermal processing under the low pressure.

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