User Guide
Why can I only view 3 results?
You can also view all results when you are connected from the network of member institutions only. For non-member institutions, we are opening a 1-month free trial version if institution officials apply.
So many results that aren't mine?
References in many bibliographies are sometimes referred to as "Surname, I", so the citations of academics whose Surname and initials are the same may occasionally interfere. This problem is often the case with citation indexes all over the world.
How can I see only citations to my article?
After searching the name of your article, you can see the references to the article you selected as soon as you click on the details section.
  Citation Number 1
 Views 8
ERP-SYSTEM RISK ASSESSMENT METHODS AND MODELS
2020
Journal:  
Radio Electronics, Computer Science, Control
Author:  
Abstract:

Abstract Context. Because assessing information security risks is a complex and complete uncertainty process, and non-appearance is a major factor influencing the effectiveness of the assessment, is advisable use vague methods and models that are adaptive to noncomputed data. The formation of vague assessments of risk factors is subjective, and risk assessment depends on the practical results obtained in the process of processing the risks of threats that have already arisen during the functioning of the organization and experience of information security professionals.

Keywords:

Citation Owners
Attention!
To view citations of publications, you must access Sobiad from a Member University Network. You can contact the Library and Documentation Department for our institution to become a member of Sobiad.
Off-Campus Access
If you are affiliated with a Sobiad Subscriber organization, you can use Login Panel for external access. You can easily sign up and log in with your corporate e-mail address.
Similar Articles












Radio Electronics, Computer Science, Control

Journal Type :   Uluslararası

Metrics
Article : 805
Cite : 251
2023 Impact : 0.025
Radio Electronics, Computer Science, Control