Abstract:

In this study, the use of the automatic Hall/Dirence (OHD) measurement system, controlled by Arduino UNO in order to reduce potential user errors, costs and difficulties in changes related to the environmental conditions for the device characterization of semiconductors, has been tested on various semiconductor samples. The electrical contacts in the Van der Pauw configuration, created on the semi-related sample surface in this developed system, are directed to the suitable outputs of twelve single-related rails with a 8-bit control signal. This process ensures the application of current from specific terminals of the tested circuit element (DUT) with appropriate control signals and the difference in voltage caused by this current is measured between the corresponding contacts. The collection of experimental data, statistical analysis and other necessary calculations can be carried out in a row within the same computer program. Therefore, it is possible to make a systematic, fast and reliable characterization. With this scaned system, the surface resistance, the concentration of the carrier in the effect of the magnetic field, the type of carrier, the mobility values can be determined in a series. When the system's performance in the application is tested for reference samples, it was observed that there was a pretty good harmony between the results of the measurement obtained. On the other hand, a lower cost and portable structure can be created with the new design measurement system. This new designed OHD measurement system also has very convenient features to characterize semiconductors depending on temperature, light strength and wave.

Keywords:

Abstract:

In this study, to reduce potential user errors, cost, and effort due to changes in environmental conditions for device characterization of semiconductors an automatic Hall/Resistance (AHD) measurement system was designed with Arduino UNO and the system was tested on various semiconductor samples. In this developed system, electrical contacts in Van der Pauw configuration formed on the semiconductor sample surface directed to the appropriate outputs of twelve single-contact relays with an 8-bit control signal. This process ensures that current applied from certain terminals of the tested circuit element (DUT) with appropriate control signals and the voltage difference caused by this current measured between the relevant contacts. Collection of experimental data, statistical analysis, and other necessary calculations can be done sequentially in the same computer program. Therefore, a systematic, fast and reliable characterization becomes possible. With this designed system, surface resistance, resistivity, and carrier concentration under the influence of the magnetic field, carrier type, and mobility values can be determined in series. When the application performance of the system was tested for reference samples, it was observed that there was a very good agreement between the measurement results obtained. On the other hand, a lower cost and portable structure created with the new design measurement system. This new designed AHD measuring system also has very convenient properties for characterizing semiconductors based on temperature, light intensity, and wavelength.