Abstract:

In this study, a low-cost and easy-to-apply electrometer design was carried out to measure low current values in the range of 0.1 nA-10 mA depending on different physical environmental conditions such as ambient temperature for semiconductor device characterization. With the logarithmic amplifier and microcontroller used, this design allows simultaneous measurement of sample temperature and low currents. The tests of the new electrometer system were carried out by making dark current measurements in the 300-450 K temperature range of the ZnO semiconductor film prepared by ultrasonic chemical spraying technique. In the study, the conductive contacts (electrode) required for electrical measurements were formed by evaporating Al on the surface of the ZnO film, whose structural, optical and surface properties were also examined. The variation of the electrical conductivity of the film depending on the temperature was obtained from the geometric factor and the measured current values determined depending on the dimensions of the mask used in the Al evaporation process. Comparative experimental results show that the designed new electrometer is cheaper and more flexible to use than the commercial electrometer. The new system is very useful for undergraduate and graduate students and researchers to simultaneously measure light intensity and even moisture-induced electrical conductivity.