Görüntüleme
7
Bu çalışmada, yarı iletken bir gürültü kaynağının “excess noise source” (ENR) değerini izlenebilir şekilde ölçmek için bir toplam güç radyometre kurulmuştur. Oldukça geniş olarak kabul edilen 50 MHz – 26,5 GHz frekans aralığında, gürültü kaynağını tek seferde ölçebilen bu sistemin testi, nominal 15 dB ENR değerine sahip standart gürültü kaynakları kullanılarak yapılmıştır. Geliştirilen toplam güç radyometre kullanılarak, değeri bilinen bir gürültü kaynağının hesaplanan ENR değerleri ile gerçek ENR değerleri arasındaki farklar ≤ç0,30ç dB olarak elde edilmiştir. Ölçülen ENR değerlerinin belirsizlikleri ise 0,13 dB ile 0,34 dB aralığında hesaplanmış olup, geçek değer ve ölçülen değer arasındaki farklar belirsizlik değerleri içerisinde bulunmuştur. In this study, a total power radiometer was established to measure the value of "excess noise source" (ENR) of a semiconductor noise source in a traceable manner. The test of this system which can measure the noise source at a time is performed between the frequency range of 50 MHz to 26.5 GHz, accepted as highly wide, by using standard noise sources with a nominal value of 15 dB ENR. The difference between the actual ENR value and the calculated ENR value of the known noise source was obtained as ≤ç0.30ç by using the developed total power radiometer. Uncertainty of the measured ENR values are calculated in the range of 0.13 dB and 0.34 dB, and the difference between the actual value and the measured value was found in the uncertainty values.
In this study, a total power radiometer was established to monitor the value of an excess noise source (ENR) of a semi-guided noise source. In the fairly widely recognized frequency range of 50 MHz to 26,5 GHz, the test of this system, which can measure the noise source at one time, was done using standard noise sources with a nominal value of 15 dB ENR. By using the developed total power radiometer, the value is achieved as the differences between the calculated ENR values of a known noise source and the actual ENR values are achieved as 0.30dB. The uncertainty of the measureed ENR values was calculated between 0.13 dB and 0.34 dB, and the differences between the transitional value and the measureed value were found in uncertainty values. In this study, a total power radiometer was established to measure the value of "excess noise source" (ENR) of a semiconductor noise source in a traceable manner. The test of this system which can measure the noise source at a time is performed between the frequency range of 50 MHz to 26.5 GHz, accepted as highly wide, by using standard noise sources with a nominal value of 15 dB ENR. The difference between the actual ENR value and the calculated ENR value of the known noise source was obtained as ≤x0.30c by using the developed total power radiometer. Uncertainty of the measured ENR values are calculated in the range of 0.13 dB and 0.34 dB, and the difference between the actual value and the measured value was found in the uncertainty values.
Alan : Mühendislik
Dergi Türü : Ulusal
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