Özet:

In this study, the effect of Lead (Pb) additive on magnesium oxide (MgO) thin films produced on glass substrates using sequential ionic layer adsorption and reaction technique (SILAR) was investigated for the first time. Uv-vis Spectroscopy, X-ray diffraction (XRD), and scanning electron microscopy (SEM) measurements were performed to examine how the optical, structural and morphological properties of the samples were affected. In the Uv-vis Spectroscopy analysis, it was recorded that the band gaps of the MgO samples decreased from 4 eV to 3.75 eV with the increase of Pb dopant concentrations. It also shows that the permeability values of MgO nanostructures increase with the increase of Pb contribution. According to XRD measurements, PbO formations were detected in MgO thin film samples due to the increase in Pb additive as well as the cubic structure of the samples. SEM measurements showed that, although all of the samples have a nanowire structure, they showed serious changes in their structure with the Pb additive. In the light of these results, it shows that Pb doping on MgO thin films can be obtained by using the SILAR deposition technique.

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