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Bu çalışmada Cu(In,Ga)(Se1-yTey)2 ince filmleri, külçe formundaki yapının elektron demeti ile buharlaştırılıp yüksek sıcaklıkta tavlanması ile elde edildi. Örneklerin X-ışını kırınım desenleri (XRD), Raman spektrumları, yüzey görüntüleri ile atomik konsantrasyon ölçümleri alınarak katkısız ve düşük Te katkılı örneklerin yapısal özellikleri ayrıntılı olarak incelenerek karşılaştırıldı. XRD desenlerinde, katkısız CIGS ince filminde, Cu(In,Ga)Se2 ve CuIn3Se5 gibi bir faz ayrışımının ortaya çıktığı, Te katkısı ile beraber faz ayrışımının ortadan kalktığı görüldü. Örneklere ait A1 Raman modlarının deneysel değerleri, teorik bir yaklaşımla elde edilen değerler ile karşılaştırıldı. Yüzey fotoğrafları incelendiğinde, Te katkısı ile beraber film yüzeyinin daha düzgün (uniform) hale geldiği ve tanelerin mikron-altı boyutlarında oluştuğu görüldü. Benzer şekilde, yapıdaki kompozisyon profilinin iyileştiği (Ga miktarının arttığı) ve hedeflenen miktarda Te’ün neredeyse yapıya girdiği görüldü.
In this study, the Cu(In,Ga)(Se1-yTey)2 thin films were obtained by the evaporation of the structure in the form of a cranberry by an electron set and the welding at high temperatures. The X-ray breakdown patterns (XRD) of the samples were compared with the structural characteristics of the non-contributed and low Te-contributed samples by taking Raman spectrum, surface images and atomic concentration measurements in detail. In the XRD patterns, in the non-contributed CIGS fine film, a phase separation such as Cu(In,Ga)Se2 and CuIn3Se5 appeared, and the phase separation with the Te contribution disappeared. The experimental values of the A1 Raman modes of the examples were compared with the values obtained by a theoretical approach. When superficial photographs were studied, it was found that the film surface became more straightforward (uniform) along with the Te's contribution and that the tanes were formed in micron-six dimensions. Similarly, it was seen that the composition profile in the structure improved (that the amount of Ga increased) and the target amount of Te almost entered the structure.
In this study, Cu(In,Ga)(Se1-yTey)2 thin films were obtained by evaporation of the bulk form compound with electron beam followed by annealing at elevated temperature. The X-ray diffraction patterns (XRD), Raman spectra, surface images and atomic concentration measurements of the samples were analyzed and compared with the structural properties of the undoped and low Te doped samples. In XRD patterns, it was observed that a phase separation such as Cu(In,Ga)Se2 and CuIn3Se5 formed in the CIGS thin film, but with the Te content, this phase separation was disappeared. Experimental values of A1 Raman modes of the samples were compared with the values obtained by a theoretical approach. It was seen that the film surface became more uniform and the particles formed in sub-micron dimensions as the Te content increase in the film. Similarly, it was observed that the composition profile in the structure improved (the amount of Ga increased) and that the targeted amount of Te almost entered the structure.
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