Özet:

The subject of this study is antimon sulphur thin films made using the ultrasonic spray pyrolysis technique. The optical and structural properties of antimon sulphur fine films prepared depending on the different altar temperature have been studied using UV-vis spectrum photometry and XRD analysis respectively. In this way, it was possible to control the optical and structural properties by changing the altar temperature. The optical characteristics of the films were analyzed by measuring the energy band range using UV-vis spectrometers. The energy band values for films made at 275, 300 and 325 °C and untouched were 2.36, 2.47 and 1.84 eV respectively, while the energy band values for films made at 500 °C in sulfur environment were 1.73, 1.76 and 1.77eV respectively. For all directions, the micro structure (e), the interdimensional distance (d), the crystal size (D) and the dislocation intensity (δ) were determined using the XRD analysis.

Özet:

The Antimony thiorea thin films which are the subject of this study were prepared by ultrasonic spray pyrolysis technique. The Antimony thiorea thin films were investigated depending on the substrate temperature. The optical and structural characteristics of these films were determined using UV–vis spectrophotometry and XRD analysis, respectively. By changing the substrate temperature, it was possible to control the optical and structural characteristic of the films. The optical properties films were analysed by energy band gap measurements using UV–vis spectrophotometry. While the band gaps of as grown films found to be 2.36, 2.47 ve 1.84eV, the band gaps of the films at annealing 500°C found to be 1.73, 1.76 ve 1.77eV.  XRD analysis was used to determine the microstrain (e), lattice spacing phase (d), crystallite size (D) and dislocation density (δ) for all orientations.

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